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Publications about 'full range-azimuth resolution products'

Articles in journal or book chapters

  1. Fabrizio Lombardini and Federico Viviani. Single-look light-burden superresolution differential SAR tomography. Electronics Letters, 52(7):557-558, 2016. Keyword(s): SAR Processing, SAR Tomography, persistent scatterer interferometry, PSI, DInSAR, multibaseline interferometry, interferometric stacking, deformation monitoring, subsidence monitoring, urban remote sensing, array signal processing, image sampling, radar imaging, radar interferometry, radar resolution, spectral analysis, synthetic aperture radar, 2D baseline-time spectral analysis framework, adaptive 2D spectral estimation, coherent multilooking processing, complex nonstationary scenes, complex-valued synthetic aperture radar data, elevation beamforming, full range-azimuth resolution products, full-3D imaging, height-velocity sidelobe reduction, layover scatterers, mature differential interferometry, multibaseline interferometry, satellites, single-look adaptive Diff-Tomo processor, single-look light-burden superresolution differential SAR tomography, sparse sampling, spatial spectral estimation. [Abstract] [bibtex-entry]


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Please note that access to full text PDF versions of papers is restricted to the Chair of Earth Observation and Remote Sensing, Institute of Environmental Engineering, ETH Zurich.
Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright.

This collection of SAR literature is far from being complete.
It is rather a collection of papers which I store in my literature data base. Hence, the list of publications under PUBLICATIONS OF AUTHOR'S NAME should NOT be mistaken for a complete bibliography of that author.




Last modified: Fri Feb 24 14:23:26 2023
Author: Othmar Frey, Earth Observation and Remote Sensing, Institute of Environmental Engineering, Swiss Federal Institute of Technology - ETH Zurich .


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